Advantest 93k - Tester Manual
Poor mechanical alignment or planarity issues between the loadboard and the socket/probe card.
Contains the central power supplies, liquid cooling distribution units, and system control boards.
When the tester halts, the manual's troubleshooting and diagnostics section is your best friend.
Undock the test head, clean the pogo pins with compressed air or specialized wipes, and re-dock. advantest 93k tester manual
The 93k operates on the Smate (Smartest) software suite (versions Smate 7 and Smate 8 are standard). Understanding the software layout is critical to aligning your workflow with the manual instructions. The Device Under Test (DUT) Browser
For Windows users, a standalone "TDC Viewer" application must be installed to read downloaded documentation packages. Linux users typically have the help viewer pre-installed with the SmarTest software environment. Core Manual Categories
A dedicated Linux computer that runs the SmarTest operating system, controlling the tester via a high-speed fiber-optic link. 2. Software Environments: SmarTest 7 vs. SmarTest 8 Poor mechanical alignment or planarity issues between the
For over two decades, the has stood as a titan in the world of semiconductor automated test equipment (ATE). Whether you are characterizing the latest 5G RF transceiver, validating a high-performance GPU, or performing structural tests on an automotive microcontroller, the 93K is likely the workhorse on your production floor.
| Feature Category | Key Capabilities & Specifications | | :--- | :--- | | | Pin Scale 1600, Pin Scale 5000B cards handling speeds over 32 Gbps ; addresses AI, High-Performance Computing (HPC) and advanced digital devices. | | RF & Wireless Testing | Wave Scale RF, Wave Scale Millimeter cards. Covers 5G/6G (sub-6 GHz & mmWave up to 70 GHz), Wi-Fi 6E/7, Bluetooth, GPS, and Ultra-Wideband (UWB). | | Mixed-Signal & Power | AVI64 card provides a broad voltage range of -40V to +80V for precision analog testing; DC Scale cards manage currents from milliamps to over 1000A , critical for high-power AI processors and automotive ICs. | | System Architecture | Multi-site efficiency (MSE) up to 99.9% with configurations supporting over 1,024 independent test sites in parallel for massive production throughput. | | Scalability (Classes) | Full compatibility across all A-class (engineering) to L-class (high-volume) test heads, protecting your investment by allowing program and hardware reuse as your needs grow. |
Writing custom test methods is an essential skill for an ATE engineer. Below are foundational programming templates for both major generations of the 93k software, demonstrating how to measure a static current or voltage. SmarTest 7 C++ Test Method Template Undock the test head, clean the pogo pins
Run lmutil lmstat -a in the Linux terminal to verify your Advantest license feature seats. DIB Interlock Open
Allows engineers to plot two variables against each other (such as Voltage vs. Frequency) to find the operating boundaries of the chip.
Advantest maintains an online portal called "Advantest Access." It features application notes that act as supplementary, real-world extensions to the static manuals.
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Your tester is a million-dollar asset. Treat its manual as the key to unlocking that investment.